Struct CircuitStat 

pub struct CircuitStat {

    pub n_gates: usize,
    pub n_eval_insn: usize,
    pub n_zero_constraints: usize,
    pub n_and_constraints: usize,
    pub n_imul_constraints: usize,
    pub n_bmul_constraints: usize,
    pub distinct_shifted_value_indices: usize,
    pub distinct_unshifted_value_indices: usize,
    pub committed_allocated: usize,
    pub n_const: usize,
    pub n_inout: usize,
    pub n_witness: usize,
    pub n_internal: usize,
    pub n_scratch: usize,
    pub scratch_peak_live: usize,
    pub zero_allocated: usize,
    pub and_allocated: usize,
    pub imul_allocated: usize,
    pub bmul_allocated: usize,
}

Various stats of a circuit that affect the prover performance.

Fields

n_gates: usize

Number of gates in the circuit.

n_eval_insn: usize

Number of instructions in the evaluation form of circuit.

Directly proportional to performance of witness filling.

n_zero_constraints: usize

Number of ZERO constraints in the circuit.

Affects performance of the shift reduction only: the Zero reduction itself carries no sumcheck.

n_and_constraints: usize

Number of AND constraints in the circuit.

Affects performance of AND reduction.

n_imul_constraints: usize

Number of IMUL constraints in the circuit.

Affects performance of intmul reduction phase.

n_bmul_constraints: usize

Number of BMUL constraints in the circuit.

Affects performance of binmul reduction phase.

distinct_shifted_value_indices: usize

Number of distinct value indices with non-zero shift in the circuit.

Every use of a value with a distinct type and amount is counted here.

Affects performance of shift reduction phase.

distinct_unshifted_value_indices: usize

Number of distinct value indices with zero shift in the circuit.

Affects performance of shift reduction phase.

committed_allocated: usize

Length of the committed trace in words, a power of two.

Affects performance of committing.

n_const: usize

Number of constant values used by the circuit.

n_inout: usize

Number of public input values in the circuit.

n_witness: usize

Number of private input values in the circuit.

n_internal: usize

Number of internal values in the circuit.

Internal values are values produced by gates.

n_scratch: usize

Number of scratch values in the circuit.

Those values are not committed, those only exist during witness generation.

scratch_peak_live: usize

Smallest scratch segment this circuit could run with.

This is the largest number of uncommitted values alive at the same time. It equals the segment length when slots are shared, and is a lower bound on it otherwise.

zero_allocated: usize

Allocated size for ZERO constraints (power of 2, or zero when there are none)

and_allocated: usize

Allocated size for AND constraints (power of 2)

imul_allocated: usize

Allocated size for IMUL constraints (power of 2)

bmul_allocated: usize

Allocated size for BMUL constraints (power of 2)

Implementations

impl CircuitStat

pub fn collect(circuit: &Circuit) -> Self

Creates a new CircuitStat instance by collecting statistics from the given circuit.

Trait Implementations

impl Display for CircuitStat

fn fmt(&self, f: &mut Formatter<'_>) -> Result

Formats the value using the given formatter.